首页> 外文会议>Indium Phosphide and Related Materials, 1991., Third International Conference. >Influence of the well composition and thickness in the GaInP/InP/GaInAs/InP structure for HEMT
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Influence of the well composition and thickness in the GaInP/InP/GaInAs/InP structure for HEMT

机译:GaInP / InP / GaInAs / InP结构中阱组成和厚度对HEMT的影响

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Photoluminescence, Hall effect, and I-V characteristics of heterostructure InP/GaInAs/InP grown by gas source molecular beam epitaxy (MBE) are presented. The structure is chosen as an alternative to AlInAs/GaInAs/AlInAs to avoid the problems related to the presence of aluminum in HEMT structures. An extremely high indium concentration is used in the well to improve its performance. The InAs well degrades above 10 AA thickness. It is shown that the best experimental results are obtained with a 60 AA GaInAs well (82% InAs) with 2% lattice mismatch.
机译:提出了通过气体源分子束外延(MBE)生长的异质结构InP / GaInAs / InP的光致发光,霍尔效应和I-V特性。选择该结构作为AlInAs / GaInAs / AlInAs的替代材料,以避免与HEMT结构中铝的存在有关的问题。孔中使用了极高的铟浓度,以改善其性能。超过10 AA的厚度,InAs的性能会下降。结果表明,使用60AA的GaInAs阱(82%的InAs)具有2%的晶格失配可获得最佳的实验结果。

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