Bridging the gap between design and testing of analog integrated circuits

摘要

It is noted that an important problem associated with analog and mixed analog/digital VLSI design has been the lack of a systematic approach to the design and testing of such integrated systems. The authors describe a computer environment that brings the different design aspects closely together. It has been used successfully to analyze the performance of high-speed flash analog/digital converters. Interaction among simulations, CAD (computer-aided design) tools, measurements, and testing is provided for in this approach.