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Recombination Processes in InAs/InAsSb Type Ⅱ Strained Layer Superlattice MWIR nBn Detectors

机译:INAS / INASSBⅡ型应变层超晶体MWIR NBN探测器的重组过程

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There is great interest in MWIR Ga-free type Ⅱ strained layer superlattice (T2SLS) nBn detectorsfor background limited photodetectors (BLIP) operating at temperatures higher than InSb (T ≥ 150Kcompared to T≈ 80-90K). Recently, Ting et al. [Proc. SPIE, Vol. 10624, 1062410-1 (2018)] reportedon measurements of the dark current and quantum efficiency (QE) for e-SWIR (λ>1.7 μm), MWIR,and LWIR Ga-free nBn T2SLS detectors. Of particular interest is the reported MWIR nBn T2SLSdata, since the measured dark current and QE provide the opportunity to analyze the measureddetector optoelectronic characteristics using optical properties obtained separately from the holeminority carrier lifetime and optical absorption coefficient data, hence no adjustable parameters. Thegoal is to develop and utilize robust modeling techniques to explain real, measured nBn detector datato understand the technology limitations and the improvements needed to optimize performance anddevice designs. A notable result is the observation that the dark current data under reverse bias (-100mV < bias ≤ 0 mV) obeys the ideal diode equation, where the saturation dark current is in agreementwith the radiative recombination rate obtained from the measured absorption coefficient and a 9 μsShockley-Read-Hall (SRH) lifetime obtained from the measured hole lifetime data. Most importantis that the expected generation-recombination (G-R) space charge current based on the 9 μs SRHlifetime is not observed as expected for an ideal nBn heterojunction detector and that increasingexcess dark currents are observed with decreasing temperature. The in-band external QE measuredat 100K is in the range of 30% and is observed to increase with increasing operating temperaturewhich indicates effects influenced by hole mobility anomalies. In contrast to the above listedobservations, the type Ⅱ Ga-free nBn detector data reported by D. Ting et al. [Appl. Phys. Lett.,113, 021101, 2018] exhibits a hole energy barrier, G-R dark current like characteristics, and bothtemperature/voltage dependent QE.
机译:对MWIR GA的Ⅱ型应变层超晶格(T2SLS)NBN探测器非常兴趣用于背景有限的光电探测器(BLIP)在高于INSB的温度下操作(T≥150K与T≈80-90K相比)。最近,Ting等人。 [proc。斯佩里,卷。 10624,1062410-1(2018)]报道关于E-SWIR(λ>1.7μm),MWIR的暗电流和量子效率(QE)的测量值,和LWIR GA-NBN T2SLS探测器。特别感兴趣的是报告的MWIR NBN T2SLS数据,由于测量的暗电流和QE提供了分析测量的机会使用光学性质与孔分开获得的检测器光电特性少数竞赛寿命和光学吸收系数数据,因此没有可调参数。这目标是开发和利用强大的建模技术来解释真实的,测量的NBN检测器数据了解技术限制和优化性能所需的改进设备设计。值得注意的结果是观察反向偏压下的暗电流数据(-100MV <偏置≤0mV)obeys是理想的二极管方程,其中饱和暗电流是一致的具有从测量的吸收系数获得的辐射重组率和9μs从测量的漏洞寿命数据中获得的震惊读音室(SRH)寿命。最重要的是基于9μsSRH的预期产生 - 重组(G-R)空间电荷电流对于理想的NBN异质结检测器并且增加,未观察到寿命并增加通过降低温度观察到过量的暗电流。测量带内的外部QE在100k的范围内,观察到随着工作温度的增加而增加这表明受孔流动性异常影响的影响。与上面列出的相反观察结果,D. Ting等人报告的Ⅱ型GA无NBN检测器数据。 [苹果。物理。吧。,113,021101,2018]展示孔能量屏障,G-R暗电流,如特征,两者均温度/电压依赖QE。

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