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a-Si:H/c-Si interface hydrogenation for implied Voc = 755 mV in Silicon heterojunction solar cell

机译:硅异质结太阳能电池中隐含V oc = 755 mV的a-Si:H / c-Si界面氢化

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The amorphous (a-Si:H) and crystalline silicon (c-Si) interface plays a pivotal role in determining the Voc of the silicon heterojunction solar cell. Extrinsic hydrogenation by plasma treatment of the a-Si:H films is shown in this work to be a viable option to reduce the interface recombination. The mechanism of hydrogenation has been studied by analyzing the H bond configuration using Fourier Transform Infrared Spectroscopy and Raman spectroscopy. We have obtained an implied Voc of 755 mV and minority carrier lifetime of 4.6 ms for 10 nm thick hydrogen treated intrinsic a-Si:H films on textured n-type Cz silicon wafers. The proof of concept has been validated by fabricating front junction cells having Voc of 729 mV, with our best cell results reaching 20.2% efficiency.
机译:非晶硅(a-Si:H)和晶体硅(c-Si)界面在确定V时起关键作用 oc 硅异质结太阳能电池的结构。这项工作表明,通过等离子处理a-Si:H薄膜进行外加氢是减少界面复合的可行选择。通过使用傅立叶变换红外光谱和拉曼光谱分析H键构型,研究了氢化机理。我们获得了一个隐含的V oc 在织构化的n型Cz硅晶片上进行10 nm厚氢处理的本征a-Si:H膜的755 mV电压和4.6 ms的少数载流子寿命。通过制造具有V的前结单元已经验证了概念验证 oc 729 mV的电池,我们的最佳电池结果达到了20.2%的效率。

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