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a-Si:H/c-Si interface hydrogenation for implied Voc = 755 mV in Silicon heterojunction solar cell

机译:A-Si:H / C-Si接口氢化用于隐含的V oc = 755 mV在硅杂函数太阳能电池中

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The amorphous (a-Si:H) and crystalline silicon (c-Si) interface plays a pivotal role in determining the Voc of the silicon heterojunction solar cell. Extrinsic hydrogenation by plasma treatment of the a-Si:H films is shown in this work to be a viable option to reduce the interface recombination. The mechanism of hydrogenation has been studied by analyzing the H bond configuration using Fourier Transform Infrared Spectroscopy and Raman spectroscopy. We have obtained an implied Voc of 755 mV and minority carrier lifetime of 4.6 ms for 10 nm thick hydrogen treated intrinsic a-Si:H films on textured n-type Cz silicon wafers. The proof of concept has been validated by fabricating front junction cells having Voc of 729 mV, with our best cell results reaching 20.2% efficiency.
机译:无定形(A-Si:H)和晶体硅(C-Si)界面在确定V中起着枢轴作用 oc 硅的异质结太阳能电池。通过等离子体处理A-Si:H薄膜的外在氢化在这项工作中示出为减少界面重组的可行选择。通过使用傅里叶变换红外光谱和拉曼光谱分析H键配置,研究了氢化机制。我们已经获得了隐含的v oc 在纹理N型CZ硅晶片上为10nm厚的氢处理的755mV和少数群体寿命为4.6ms厚的氢气所属型A-Si:H薄膜。通过制造具有V的前接线单元来验证概念证明 oc 729英米米,我们最好的细胞结果达到20.2%的效率。

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