首页> 外文会议>Annual International Conference of the IEEE Engineering in Medicine and Biology Society >Effectiveness of CRT-D Versus ICD on Prevention of Electrical Storm: Big Data from the USA *
【24h】

Effectiveness of CRT-D Versus ICD on Prevention of Electrical Storm: Big Data from the USA *

机译:CRT-D与ICD在预防电风暴方面的有效性:来自美国的大数据 *

获取原文

摘要

Patients with implantable cardioverter-defibrillator (ICD) are at the risk of electrical storm (ES) occurrence associated with mortality and poor quality of life. Cardiac resynchronization therapy with defibrillator (CRT-D) minimizes inappropriate ICD shocks. However, limited reports exist on the impact of CRT-D versus traditional ICD on ES occurrences in real-life cohorts. We evaluated the implanted-device characteristics associated with ES events in a large data based on daily stored device-summaries obtained from remote monitoring data in US.Between 2004 and 2016, 19,935 US patients were implanted. Survival analyses with Cox regression for device-shock therapy were performed between patients who experienced at least one ES and those without ES. CRT-D devices (bi-ventricular) were implanted in 5522 (28%) patients during this period, and their ES events over time were compared to ICD recipients implanted with RV lead. Primary endpoint was the first ES event.ES occurred with the rate of 7.26% for all patients during the period. Cox regression analyses revealed significantly an increase risk in ES occurrences (the p-value < 0.05 and hazard ratio 1) with shock therapy. CRT-D implant led to lower ES risk comparing with patients received traditional ICD (RV only).
机译:植入式心脏复律除颤器(ICD)患者处于发生电风暴(ES)的危险中,与死亡和生活质量低下有关。使用除颤器(CRT-D)进行的心脏再同步治疗可最大程度地减少不适当的ICD冲击。然而,关于CRT-D与传统ICD对现实人群中ES发生的影响的报道很少。我们根据从美国远程监测数据获得的每日存储的设备摘要,在大数据中评估了与ES事件相关的植入设备的特征.2004年至2016年之间,共植入了19935名美国患者。在经历至少一种ES的患者和没有ES的患者之间进行了用Cox回归进行设备冲击疗法的生存分析。在此期间,将CRT-D装置(双心室)植入了5522名(28%)患者中,并将他们随时间推移的ES事件与植入RV铅的ICD接受者进行了比较。主要终点是首次发生ES事件。在此期间,所有患者的ES发生率为7.26%。 Cox回归分析显示,休克疗法导致ES发生的风险显着增加(p值<0.05和危险比>> 1)。与接受传统ICD(仅RV)的患者相比,CRT-D植入物可降低ES风险。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号