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Effect of Quenching on Dielectric Properties of ZnO Varistor Ceramics

机译:淬火对ZnO压敏陶瓷介电性能的影响

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ZnO varistor ceramics quenched under different temperatures were investigated from the aspect of dielectric responses. Nonlinear coefficient a and electrical breakdown field E_(1mA) were significantly different when quenching temperature was around 600 °C. From dielectric responses under low temperatures, it was found that densities of both zinc interstitials and oxygen vacancies increased at first and then decreased when quenching temperature decreased from 1200 °C to room temperature. Noticeably, the quenching temperature where zinc interstitial density reaches its peak was lower than that for oxygen vacancy, suggesting that oxygen vacancies were more sensitive to the ambient temperature. For dielectric responses under high temperatures, DC conductance was so intense that relaxations with long relaxation times were covered and not easily characterized via traditional dielectric spectra. Therefore, an improved dielectric spectroscopy free of DC conductance was employed. In samples quenched below 600 °C, two distinct relaxations originated from interfacial polarization and interface states were found. The interface polarization only appears when quenching temperature is below 600 °C, accompanied by notably improved resistance in small-current region. With quenching temperature increased, a new low frequency dielectric relaxation appeared, whose origin still needs further investigation.
机译:从介电响应的角度研究了在不同温度下淬火的ZnO压敏电阻陶瓷。当淬火温度为600°C左右时,非线性系数a和击穿电场E_(1mA)显着不同。从低温下的介电响应中发现,当淬火温度从1200°C降至室温时,锌间隙和氧空位的密度先增加,然后降低。值得注意的是,锌间隙密度达到峰值的淬火温度低于氧空位的淬火温度,这表明氧空位对环境温度更敏感。对于高温下的介电响应,直流电导是如此之强,以至于覆盖了具有长弛豫时间的弛豫,并且不易通过传统的介电谱进行表征。因此,采用了一种没有直流电导的改进的介电谱。在淬灭温度低于600°C的样品中,发现了两个明显的弛豫,它们是由界面极化和界面态引起的。界面极化仅在淬火温度低于600°C时出现,并伴随着小电流区域中电阻的显着改善。随着淬火温度的升高,出现了新的低频介电弛豫,其起源仍需进一步研究。

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