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The experiment study of double grid to enhance electron transmission in field emission

机译:双栅增强场发射电子传输的实验研究

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The high electrons interception rate of grid in field emission will lead to gas desorption, cathode emission drop, grid deformation, short circuit and so on which will greatly affect the reliability of the device. In this paper, the double grid structure is used to improve the electronic transmission of the grid. The experimental results show that the electron transmission can be improved effectively.
机译:栅极在场发射中的高电子截留率会导致气体解吸,阴极发射降,栅极变形,短路等,将极大地影响器件的可靠性。在本文中,双栅格结构用于改善栅格的电子传输。实验结果表明,可以有效地改善电子传输。

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