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Sintering Of Hybrid Nano Sliver Paste Achieve Cone-Structured Cu Bonding in die attachment

机译:混合纳米银浆的烧结在芯片附着中实现了锥形结构的铜键合

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In this paper, towards to the problem existed in sintering of nano sliver paste used in electronic packaging devices, we take corresponding measures and achieved very good results. Nano silver paste, because of its low-temperature sintering characteristics, is generally considered as a substitute for lead-free solder for high temperature applications. There still exist some serious problem in the sintered sliver paste die attachment, which limit its application in production. For example, high porosity and voids, poor wettability at interfaces, which decrease thermal and electrical conductivity and mechanical strength of the sintered join, breaks often occur at the interface between copper and sintered silver. We adopt electroless plating method growing copper cones on copper, and its surface morphology were characterized by Scanning Electron Microscope. Copper cone structure increase contact surface with sliver particle and forming mechanical interlock. For improve the wettability and reduce voids, we plus low melting point material tin to sliver paste to prepare hybrid nano sliver paste. This study aims at address these issues and concentrates on mechanical and microstructural characterizations of the attachment. Experiment shows that, Cu cone together with hybrid sliver paste had achieved an remarkable bonding interface and bring this technology much closer to practical use for high temperature and high power applications.
机译:针对电子包装设备中使用的纳米银浆的烧结存在的问题,我们采取了相应的措施,取得了很好的效果。纳米银浆由于其低温烧结特性,通常被认为是高温应用中无铅焊料的替代品。烧结的银浆糊模头附件仍然存在一些严重的问题,这限制了其在生产中的应用。例如,高孔隙率和空隙,在界面处的可湿性差,这降低了烧结接头的导热性和导电性以及机械强度,经常在铜和烧结银之间的界面处发生断裂。我们采用化学镀法在铜上生长铜锥,并通过扫描电子显微镜对其表面形貌进行了表征。铜锥结构增加了与银屑颗粒的接触表面,并形成了机械互锁。为了提高润湿性并减少空隙,我们将低熔点材料锡添加到银浆中,以制备混合纳米银浆。这项研究旨在解决这些问题,并专注于附件的机械和微观结构表征。实验表明,铜锥与混合银浆实现了显着的粘合界面,使该技术更接近高温和高功率应用的实际应用。

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