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Influence of Applied Power in Microwave Hydrogen Plasma Annealing on Aluminum doped Zinc Oxide/Tin doped Indium Oxide Bilayer Films for Low Emissivity Application

机译:微波氢等离子体退火中施加功率对低发射率应用铝掺杂氧化锌/锡掺杂氧化铟双层薄膜的影响

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Low emissivity (Low-E) glass shows not only high reflectivity in infrared light, but also high visible light transmission applied in energy saving buildings. The smaller low-e glass emissivity is, the higher infrared reflection is for low-e glass. Low electrical resistivity reduces emissivity of low e functional materials like transparent conductive oxides. Microwave hydrogen plasma annealing can lower the electrical resistivity of zinc oxide studied before. Applied power is one of key factors in plasma annealing. In this study, aluminum doped zinc oxide and tin doped indium oxide bilayer (AZO/ITO) films were sequentially deposited on glass substrates by in-line sputtering. The AZO/ITO films were post-annealed in microwave hydrogen plasma at 400W, 600W and 800W separately. The optimized power in microwave plasma with respect to plasma annealed AZO/ITO films as the good candidate of low-e glass was tried to be found. Experiment results indicates applied power in plasma annealing of AZO/ITO samples indeed influences the structure and electrical properties. The plasma power at 600W corresponds to lowest electrical resistivity and emissivity of AZO/ITO films among all test samples. The electrical resistivity of 400, 600 and 800W plasma annealed AZO/ITO samples are 4.68×10-4, 4.22×10-4 and 4.47×10-4 Ω-cm respectively, which decreases 55%, 59% and 57% compared with that of the as-deposited ones. Decrease of electric resistivity for hydrogen plasma annealing could be ascribed to 1. desorption of negatively charged oxygen from grain boundary; 2. substitution of matrix atoms such as zinc and indium atoms with impurity atoms such as aluminum and tin atoms in AZO/ITO films. The lowest emissivity in all plasma annealed AZO/ITO films is 0.1 corresponding to 600W plasma annealed AZO/ITO films. Emissivity of 600W plasma annealed AZO/ITO films is 58% lower than that of as-deposited AZO/ITO films. The average transmittance in visible wavelength (380~780 nm) of all plasma annealed AZO/ITO films is over than 83%. This paper contributes to industry of energy saving buildings.
机译:低辐射(Low-E)玻璃不仅显示出在红外光中的高反射率,而且还显示了在节能建筑中应用的高可见光透射率。低辐射玻璃的发射率越小,低辐射玻璃的红外反射就越高。低电阻率会降低低e功能材料(如透明导电氧化物)的发射率。微波氢等离子体退火可以降低以前研究的氧化锌的电阻率。施加功率是等离子体退火的关键因素之一。在这项研究中,铝掺杂的氧化锌和锡掺杂的氧化铟双层(AZO / ITO)膜通过在线溅射顺序沉积在玻璃基板上。将AZO / ITO薄膜分别在400W,600W和800W的微波氢等离子体中进行后退火。试图找到相对于等离子体退火的AZO / ITO薄膜作为低辐射玻璃的良好候选者的微波等离子体的最佳功率。实验结果表明,在AZO / ITO样品的等离子退火中施加的功率确实会影响结构和电性能。 600W的等离子功率对应于所有测试样品中最低的AZO / ITO膜的电阻率和发射率。 400、600和800W等离子退火的AZO / ITO样品的电阻率为4.68×10 -4 ,4.22×10 -4 和4.47×10 -4 Ω-cm分别比沉积的Ω-cm降低55%,59%和57%。氢等离子体退火的电阻率的降低可归因于1.带负电荷的氧从晶界脱附; 2。 2.在AZO / ITO膜中用诸如铝和锡原子之类的杂质原子取代诸如锌和铟原子之类的基质原子。在所有等离子退火的AZO / ITO膜中的最低发射率是0.1,对应于600W等离子退火的AZO / ITO膜。 600W等离子退火的AZO / ITO薄膜的发射率比沉积的AZO / ITO薄膜低58%。所有等离子退火的AZO / ITO薄膜在可见光波长(380〜780 nm)的平均透射率均超过83%。本文为节能建筑行业做出了贡献。

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