首页> 外文会议>International Conference on Communications, Circuits and Systems >An Advanced Model for Calculating the Effective Capacitance Considering Input Waveform Effect
【24h】

An Advanced Model for Calculating the Effective Capacitance Considering Input Waveform Effect

机译:考虑输入波形效应的有效电容计算的先进模型

获取原文

摘要

In deep submicron designs, predicting gate delays is a noteworthy work for Static Timing Analysis (STA). The effective capacitance C{sub}(eff) concept is usually used to calculate the gate delay of interconnect load. Conventionally, the input-signal is assumed as ramp waveform. However, the input waveform is also the output of CMOS gates with interconnect wires. Thus the simple assumption as a ramp signal results in significant influence on the delay calculating. In this paper, an advanced effective capacitance model is proposed to consider both the input waveform effect and interconnect wire load, where the nonlinear influence of input waveform is modeled as one part of effective capacitance of capacitive load to compute the gate delay. Experimental results show a significant improvement in accuracy when the input waveform effect is considered.
机译:在深度亚微米设计中,预测门延迟是静态时序分析(STA)的值得注意的工作。通常用于计算互连负载的栅极延迟的有效电容C {sub}(eff)概念。通常,输入信号被假定为斜坡波形。然而,输入波形也是具有互连线的CMOS栅极的输出。因此,作为斜坡信号的简单假设导致对延迟计算的显着影响。在本文中,提出了一种先进的有效电容模型来考虑输入波形效应和互连线负载,其中输入波形的非线性影响被建模为电容负载的有效电容的一部分,以计算栅极延迟。实验结果表明当考虑输入波形效果时的精度显着提高。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号