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An Advanced Model for Calculating the Effective Capacitance Considering Input Waveform Effect

机译:考虑输入波形效应的有效电容计算高级模型

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In deep submicron designs, predicting gate delays is a noteworthy work for Static Timing Analysis (STA). The effective capacitance Ceff concept is usually used to calculate the gate delay of interconnect load. Conventionally, the input-signal is assumed as ramp waveform. However, the input waveform is also the output of CMOS gates with interconnect wires. Thus the simple assumption as a ramp signal results in significant influence on the delay calculating. In this paper, an advanced effective capacitance model is proposed to consider both the input waveform effect and interconnect wire load,where the nonlinear influence of input waveform is modeled as one part of effective capacitance of capacitive load to compute the gate delay. Experimental results show a significant improvement in accuracy when the input waveform effect is considered.
机译:在深亚微米设计中,预测栅极延迟是静态时序分析(STA)的一项值得注意的工作。有效电容Ceff概念通常用于计算互连负载的栅极延迟。传统上,将输入信号假定为斜坡波形。但是,输入波形也是带有互连线的CMOS门的输出。因此,简单假设为斜坡信号会对延迟计算产生重大影响。本文提出了一种同时考虑输入波形效应和互连线负载的高级有效电容模型,其中将输入波形的非线性影响建模为电容负载有效电容的一部分,以计算栅极延迟。实验结果表明,在考虑输入波形效应的情况下,精度有了显着提高。

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