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Radiation tolerance demonstration of high-speed scrubbing on an optically reconfigurable gate array

机译:光学可重构门阵列上高速擦洗的辐射耐受性演示

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Recently, field programmable gate arrays (FPGAs) are anticipated for use in high-radiation environments such as the Fukushima Daiichi nuclear power plant. According to recent news, regions with 650 Sv/h radiation have been found at the Fukushima Daiichi nuclear power plant. Under such extremely high radiation environments, high-speed scrubbing operations must be used to maintain correct circuit information on the configuration memory of programmable gate arrays. Up to now, optical high-speed scrubbing based on an optically reconfigurable gate array has been proposed. This paper presents a demonstration of the radiation tolerance of the optical high-speed scrubbing based on an optically reconfigurable gate array VLSI by using lasers that emulate strong radiation environments. It has been confirmed that 70-ns period high-speed scrubbing operations on the optically reconfigurable gate array are never disturbed by the emulated radiation.
机译:近来,现场可编程门阵列(FPGA)有望用于高辐射环境,例如福岛第一核电站。根据最新消息,在福岛第一核电站发现了辐射速度为650 Sv / h的地区。在如此极高的辐射环境下,必须使用高速擦洗操作来在可编程门阵列的配置存储器上保持正确的电路信息。迄今为止,已经提出了基于光学可重构门阵列的光学高速擦洗。本文通过使用可模拟强辐射环境的激光器,演示了基于光学可重构门阵列VLSI的光学高速擦洗的辐射容限。已经证实,光学可重构门阵列上70 ns周期的高速擦洗操作不会受到仿真辐射的干扰。

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