Optically Reconfigurable Gate Array Write State Inspection Method, Write State Inspection Device, and Optically Reconfigurable Gate Array

摘要

To provide a technology for inspecting a write state without requiring a dedicated circuit for write state inspection of a logical circuit in an ORGA. Upon switching an optical signal to be irradiated an optically reconfigurable bit element as an inspection target from ON to OFF, in the logical circuit structure of the ORGA, first and second optical signal patterns having the optical signal ON/OFF to be irradiated to the optically reconfigurable bit element serving as optical signal patterns configuring the logical structure in which at least one logical level or output impedance changes are sequentially irradiated and input to the logical circuit. In addition, an output-state detection circuit that is connected to the logical output terminals and detects whether the logical level of the output terminal is at eh H level, L level, or high impedance detects the output state. By comparing the detected state with the normal output state of the input optical signal pattern, it is judged whether the information write state of the optically reconfigurable bit element with the optical signal is successful or unsuccessful.