首页>
外国专利>
Optically reconfigurable gate array writing state inspection method, writing state inspection device, and optically reconfigurable gate array
Optically reconfigurable gate array writing state inspection method, writing state inspection device, and optically reconfigurable gate array
展开▼
机译:光可重构门阵列写入状态检查方法,写入状态检查装置和光可重构门阵列
展开▼
页面导航
摘要
著录项
相似文献
摘要
A technology for inspecting a write state without requiring a dedicated circuit for write state inspection of a local circuit in an ORGA. Upon switching an optical signal to be irradiated on an optically reconfigurable bit element as an inspection target from ON to OFF, in the logical circuit structure of the ORGA, first and second optical signal patterns having the optical signal ON/OFF to be irradiated to the optically reconfigurable bit element serving as optical signal patterns configuring the logical structure in which at least one logical level or output impedance changes are sequentially irradiated and input to the logical circuit. In addition, an output-state detection circuit that is connected to the logical output terminals and detects whether the logical level of the output terminal is at an H level, L level, or high impedance detects the output state.
展开▼