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Lifetime modeling based on anodic oxidation failure for packages with internal galvanic isolation

机译:基于内部电隔离的包装基于阳极氧化失效的寿命模型

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摘要

In More-than-Moore technologies, the number and complexity of micro and nano devices, that are directly integrated into control units of power electronics and mechatronics systems, increase. These systems typically operate at working voltages in the range of 220–1000 VRMS [1].
机译:在比摩尔技术中,直接集成到电力电子和机电一体化系统的控制单元中的微型和纳米设备的数量和复杂性都在增加。这些系统通常在220–1000 VRMS的工作电压下运行[1]。

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