Part-to-part and lot-to-lot variability study of TID effects in bipolar linear devices

摘要

Process-induced variability between parts and lots is a critical issue for space applications and Radiation Hardness Assurance (RHA). The one-sided tolerance limit method is commonly used to take this variability into account. This study explores the possibility to consider a more sophisticated statistical analysis. The impact of the current trend to reduce the number of tested parts for radiation lot acceptance tests is also studied.