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Continuing evaluation of bipolar linear devices for total dose bias dependency and ELDRS effects

机译：持续评估双极线性器件的总剂量偏差依赖性和ELDRs效应

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摘要

We present results of continuing efforts to evaluate total dose bias dependency and ELDRS effects in bipolar linear microcircuits. Several devices were evaluated, each exhibiting moderate to significant bias and/or dose rate dependency.

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作者
McClure, S. S.; Gorelick, J. J.; Yui, C. C.; Rax, B. G.; Wiedeman, M. D.;
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年度 2003
页码 1-10
总页数 10
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
BIAS; BIPOLARITY; DOSAGE; MICROELECTRONICS; ELDRS total dose bias dependency bipolar linear microcircuits dose rate; dependency;

机译：偏压;两极;剂量;微电子; ELDRs总剂量偏差依赖性双极线性微电路剂量率;依赖;

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专利

1. Passivation layers for reduced total dose effects and ELDRS in linear bipolar devices [J] . Shaneyfelt M.R., Pease R.L., Maher M.C., IEEE Transactions on Nuclear Science . 2003,第6期

机译：钝化层可降低线性双极型器件的总剂量效应和ELDRS
2. Total Ionizing Dose Effects in MOS and Low-Dose-Rate-Sensitive Linear-Bipolar Devices [J] . Fleetwood D.M. IEEE Transactions on Nuclear Science . 2013,第3aPart2期

机译：MOS和低剂量率敏感的线性双极型器件中的总电离剂量效应
3. Bias Effects on Total Dose-Induced Degradation of Bipolar Linear Microcircuits for Switched Dose-Rate Irradiation [J] . Velo Y. G., Boch J., Roche N. J.-H., Nuclear Science, IEEE Transactions on . 2010,第4期

机译：偏置对开关剂量率辐射双极线性微电路总剂量诱导降解的影响
4. Continuing Evaluation of Bipolar Linear Devices for Total Dose Bias Dependency and ELDRS Effects [C] . Steven S. McClure, Jerry L. Gorelick, Candice C. Yui, IEEE Radiation Effects Data Workshop . 2003

机译：持续评估双极线性装置，用于总剂量偏置依赖性和ELDRS效应
5. Total Ionizing Dose Radiation Effects and Negative Bias Temperature Instability on SiGe pMos Devices [D] . Duan, Guoxing. 2016

机译：SiGe PMOS器件上的总电离剂量辐射效应和负偏置温度不稳定性
6. Radiographic evaluation of linear wear of bipolar hemiarthroplasty devices in vivo [O] . Nobuhiro Kaku, Shouhei Noda, Tomonori Tabata, 2019

机译：体内双极性半序成形术装置线性磨损的放射线图评价
7. Total ionizing dose effects on MOS and bipolar devices in the natural space radiation environment [O] . Fleetwood, D. M. 1998

机译：在自然空间辐射环境中，总电离剂量对mOs和双极器件的影响
8. Total dose bias dependency and ELDRS effects in bipolar linear devices [R] . Yui, C. C., McClure, S. S., Rex, B. G., 2002

机译：双极线性器件中的总剂量偏差依赖性和ELDRs效应

Continuing evaluation of bipolar linear devices for total dose bias dependency and ELDRS effects

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