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Phonon Mean Free Path - Thermal Conductivity Relation in AlN

机译:校友意味着ALN中的自由路径 - 热导率关系

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摘要

The challenging high temperature operation conditions for AlN based electronic devices such as UV LEDs and HEMTs may cause degradation and failure. In these applications, thermal conductivities of the material layers have a critical role in heat dissipation and device temperature reduction. Thermal conductivity and phonon mean free path calculations lead to better understanding of the thermal transport in such devices with small scales. This study aims to perform ab-initio calculations via VASP to obtain up to third-order force constants and feed them to Phono3py to calculate the phonons' contributions to the thermal conductivity of AlN. The results can be used to determine the onset of nanoscale thermal transfer in devices that consists of such materials and to determine a proper mean free path for nanoscale thermal simulations.
机译:基于UV LED和HEMT的ALN基于电子设备的挑战高温操作条件可能会导致降解和失败。在这些应用中,材料层的热导率在散热和器件温度降低中具有关键作用。导热系数和声子意味着自由路径计算导致更好地了解具有小刻度的这种装置中的热传输。本研究旨在通过VASP执行AB-Initio计算,以获得最多的第三阶常量,并将其馈送到Phono3Py以计算ALN的热导率的贡献。结果可用于确定由这些材料组成的装置中纳米级热传输的发作,并确定纳米级热模拟的适当平均自由路径。

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