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Electrical properties of ZnO/TiO2 nanocomposite film deposited by simultaneous Radio-Frequency Magnetron sputtering

机译:通过同时射频磁控溅射沉积ZnO / TiO2纳米复合膜的电性能

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In this work, the ZnO/TiO2 nanocomposite thin films were prepared by simultaneous Radio-Frequency Magnetron sputtering of ZnO and TiO2 targets on glass substrates at different deposition times in the range of 30–75 minutes that increases the film thickness. The electrical and surface morphology were characterized by I-V measurement and atomic force microscopy (AFM) measurement respectively. The electrical characteristics indicate that the conductivity increases as the thickness increase due to the improvement in surface contact between particles and photocatalytic activity. High conductivity at 1.67×10−4 S/cm and lowest resistivity about 5.14×104 Ω/cm have been obtained for 75 minutes deposition time. Atomic force microscopy (AFM) showed particle size of ZnO/TIO2 thin films increases from 26nm to 50nm with an increasing in deposition time.
机译:在这项工作中,通过在不同沉积时间的玻璃基板上同时射频磁控溅射来制备ZnO / TiO 2 纳米复合薄膜。在不同沉积时间的玻璃基板上的玻璃基板上的靶标 30-75分钟的范围增加薄膜厚度。 通过I-V测量和原子力显微镜(AFM)测量的特征在于电气和表面形态。 电特性表明,由于颗粒和光催化活性之间的表面接触的改善,电导率随着厚度的增加而增加。 1.67× 10 − 4 s / cm和大约5.14× 10 4 &#x2126的最低电阻率 获得75分钟的沉积时间。 原子力显微镜(AFM)显示ZnO / TiO 2 薄膜的粒度从26nm到50nm增加,随着沉积时间的增加而增加。

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