ROST-C: Reliability driven optimisation and synthesis techniques for combinational circuits

摘要

Traditional logic synthesis methodologies are driven by timing, power, and area constraints. However, due to aggressive technology shrinking and lower power requirements, circuit reliability is fast turning out to be yet another major constraint in the VLSI design flow. Soft errors, which traditionally affected only the memories, are now also resulting in logic circuit reliability degradation. In this paper, we present a systematic and integrated methodology to address and improve the combinational circuit reliability measured in terms of Soft Error Rate (SER). The proposed SER reduction framework makes use of rewriting based logic optimisation technique which employs local transformations. The main idea behind our proposal is to replace parts of the circuit with functionally equivalent but more reliable counterparts chosen from a pre-computed subset of Negation-Permutation-Negation (NPN) classes of 4-variable functions. Cut enumeration and Boolean matching driven by reliability aware optimisation algorithm are used to identify best possible replacement candidates. Our experiments on a set of MCNC benchmark circuits indicate that the proposed framework can achieve up to 75% reduction of output error probability. On average, about 14% SER reduction is obtained at the expense of very low area overhead of 6.57% that results in 13.52% higher power consumption.