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A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets

机译:防止双节点upsets的六十分耦合SRAM单元

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In this paper, we propose a sextuple cross-coupled SRAM cell, namely SCCS18T, protected against double-node upsets. Since the proposed SCCS18T cell forms a large feedback loop for value retention and error interception, the cell can provide self-recoverability from any single-node upsets (SNUs) and partial double-node upsets (DNUs). Moreover, the proposed cell has optimized operation speed due to the use of six access transistors. Simulation results show that the SCCS18T cell can save approximately 65% read access time at the cost of 49% power dissipation and 50% silicon area on average, compared with typical hardened SRAM cells.
机译:在本文中,我们提出了一种六十六耦合SRAM单元,即SCCS18T,受到双节点upsets的保护。由于所提出的SCCS18T单元格式为值保留和误差拦截形成大的反馈回路,因此该单元可以提供来自任何单节点upsets(SNU)和部分双节点upsets(DNU)的自恢复性。此外,由于使用六个接入晶体管,所提出的电池具有优化的操作速度。仿真结果表明,与典型的硬化的SRAM细胞相比,SCCS18T电池可以节省大约65%的读取接入时间和50%硅地区的读取接入时间和50%的硅区域。

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