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Advanced interconnect equipment and process development

机译:先进的互连设备和工艺开发

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With increased demand for higher reliability in power modules and the automotive industry, aluminum-based interconnects are becoming one of the bottlenecks in module performance and will potentially be replaced by copper-based advanced interconnects. This paper lists the challenges that have to be overcome before the replacement can really happen, and introduces solutions that K&S is working on to overcome those challenges. An overall solution consisting of equipment, bond heads, consumables, and bonding processes is being developed and provided to customers for evaluation. A configurable bond head with critical features was developed to enable the advanced interconnect development, providing enough ultrasonic power, bond force, and cutting system rigidity. It can be easily reconfigured within an hour, among 3 configurations, to test different bonding materials and packaging platforms. To improve consumable lifetime, a ridged bond tool (a K&S patented design), that has better coupling to copper (Cu) wire, and a cutter blade, made of wearable material, were developed and demonstrated to have a >100,000 bond life time. The bonding mechanism for Cu-based bonding materials is sophisticated and very different from that of Al-based materials. A multi-phase bond profile was proposed and a multi-segmented bonding program was developed to enable parameter optimization at each stage of the bonding process to achieve a better bond quality. A stable process of >100,000 bonds was demonstrated in our lab.
机译:随着对功率模块和汽车行业对更高可靠性的需求不断增长,铝基互连正在成为模块性能的瓶颈之一,并且有可能被铜基高级互连所取代。本文列出了真正实现替换之前必须克服的挑战,并介绍了K&S为克服这些挑战而正在努力的解决方案。正在开发由设备,焊头,消耗品和焊工艺组成的整体解决方案,并将其提供给客户进行评估。开发了具有关键功能的可配置键合头,以实现高级互连开发,并提供了足够的超声波功率,键合力和切割系统刚性。它可以在一小时内轻松地在3种配置中进行重新配置,以测试不同的粘合材料和包装平台。为了延长易损件寿命,开发了一种与铜(Cu)线具有更好耦合性的脊形键合工具(K&S专利设计),并开发了一种由耐磨材料制成的切割刀片,并证明其使用寿命超过100,000。铜基粘结材料的粘结机理非常复杂,与铝基材料的粘结机理有很大不同。提出了多相键合曲线,并开发了多段键合程序,以使键合过程的每个阶段都能进行参数优化,从而获得更好的键合质量。在我们的实验室中,我们证明了稳定的过程> 100,000个债券。

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