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0.5-V high-speed circuit designs for nanoscale SoCs — Challenges and solutions

机译:纳米级SOC的0.5V高速电路设计 - 挑战和解决方案

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Some solutions are proposed and evaluated by simulation after the challenges facing the creation of 0.5-V nanoscale SoCs are clarified. First, the repair techniques and nanoscale FD-MOSFETs are discussed in terms of their Vt-variation. Second, 0.5-V dual-VDD dual-Vt logic circuits with gate-source reverse-biasing schemes are proposed. Third, a boosted word-voltage six-transistor (6-T) SRAM cell is evaluated with a 25-nm planar FD-SOI MOSFET and then a FinFET, revealing that the FinFET drastically improves the voltage margin and speed of the 6-T cell. Finally, the feasibility of a 0.5-V 25-nm SoC comprising a 1-Gb SRAM and 160-Mgate logic block is studied. We conclude that an SoC like this with a competitive speed while reducing the power to about one-tenth that of a conventional 1-V 32-nm CMOS LSI is possible, if the above-described devices and circuits are used and the within-wafer Vt-variations are stringently controlled and/or compensated for.
机译:一些解决方案的提出和评估通过仿真面临的0.5-V纳米的SoC创建挑战澄清之后。首先,修复技术和纳米FD-MOSFET的在其脆弱变型 - 方面进行了讨论。第二,0.5-V双-V DD 双-V 提出与栅极 - 源极反向偏置方案的逻辑电路。第三,升压字电压六晶体管(6-T)SRAM单元与25纳米的平面FD-SOI MOSFET,然后的FinFET评价,揭示了与FinFET大大提高了6-T的电压裕度和速度细胞。最后,0.5-V 25纳米的SoC包括1千兆位的SRAM和160 Mgate逻辑块的可行性进行了研究。我们的结论是这样的SoC具有竞争力的速度,同时降低功率至约十分之一,一个常规的1-V 32纳米CMOS LSI是可能的,如果所使用的上述装置和电路,以及晶片内V -variations被严格控制和/或补偿。

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