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0.5-V high-speed circuit designs for nanoscale SoCs — Challenges and solutions

机译:用于纳米级SoC的0.5V高速电路设计—挑战与解决方案

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Some solutions are proposed and evaluated by simulation after the challenges facing the creation of 0.5-V nanoscale SoCs are clarified. First, the repair techniques and nanoscale FD-MOSFETs are discussed in terms of their Vt-variation. Second, 0.5-V dual-VDD dual-Vt logic circuits with gate-source reverse-biasing schemes are proposed. Third, a boosted word-voltage six-transistor (6-T) SRAM cell is evaluated with a 25-nm planar FD-SOI MOSFET and then a FinFET, revealing that the FinFET drastically improves the voltage margin and speed of the 6-T cell. Finally, the feasibility of a 0.5-V 25-nm SoC comprising a 1-Gb SRAM and 160-Mgate logic block is studied. We conclude that an SoC like this with a competitive speed while reducing the power to about one-tenth that of a conventional 1-V 32-nm CMOS LSI is possible, if the above-described devices and circuits are used and the within-wafer Vt-variations are stringently controlled and/or compensated for.
机译:在阐明了创建0.5V纳米级SoC所面临的挑战之后,提出了一些解决方案并通过仿真进行了评估。首先,根据其V t 变化来讨论修复技术和纳米级FD-MOSFET。其次,提出了具有栅极-源极反向偏置方案的0.5V Dual-V DD 双V t 逻辑电路。第三,先对升压字电压六晶体管(6-T)SRAM单元进行了评估,首先使用25nm平面FD-SOI MOSFET,然后使用FinFET进行评估,表明FinFET极大地提高了6-T的电压裕度和速度细胞。最后,研究了包含1 Gb SRAM和160 Mgate逻辑模块的0.5 V 25 nm SoC的可行性。我们得出的结论是,如果使用上述设备和电路以及晶圆内芯片,则具有这样的SoC且具有竞争力的速度,同时将功耗降低到传统1-V 32 nm CMOS LSI的十分之一是可能的V t 变量受到严格控制和/或补偿。

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