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Evaluation system for power loss identification of perspective wide bandgap semiconductor transistors

机译:透视宽带隙半导体晶体管电力损耗识别评估系统

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The paper presents a system for measuring switching and conductivity losses for different types of transistors. The measurement system is composed of hardware and software that evaluates the total transistor losses from instantaneous values. The hardware part consists of a test board that includes a power supply, transistor driver, measurement points, transistor, freewheel diode and oscilloscope. The software part (GUI) is done in Matlab, which displays the measured voltage and current waveforms and the calculated transistor losses. The result of the article is the measured loss values at different switching frequencies and power.
机译:本文提出了一种用于测量不同类型的晶体管的切换和电导率损耗的系统。测量系统由硬件和软件组成,可从瞬时值评估总晶体管损耗。硬件部分由一个测试板组成,包括电源,晶体管驱动器,测量点,晶体管,飞轮二极管和示波器。软件部分(GUI)在MATLAB中完成,显示测量的电压和电流波形和计算出的晶体管损耗。该物品的结果是不同的开关频率和功率下的测量值。

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