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Design of a 800V VDMOS termination structure

机译:800V VDMOS终端结构的设计

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摘要

The termination structure of 800 V VDMOS has been designed, which consists of the floating field limit ring and the filed plate to reduce the peak of the electric field and make it flat at the silicon surface. By the simulation, the breakdown-voltage 880 V has been achieved with 230 μm length termination structure, and the termination's reliability has been improved owing to 2.4E+5 V*cm of the maximum surface electric field. The process technology of this device is simple without additional masks and steps.
机译:设计了800 V VDMOS的端接结构,该结构由浮动场限制环和场板组成,以减小电场的峰值并使其在硅表面处平坦。通过仿真,使用230μm长的端接结构实现了880 V的击穿电压,并且由于最大表面电场为2.4E + 5 V * cm,提高了端接的可靠性。该设备的工艺技术很简单,无需额外的掩膜和步骤。

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