首页> 外文会议>Conference on Ph. D. Research in Microelectronics and Electronics >The impact of the Q-factor of the parasitic capacitances of RF transistors on their load modulation capabilities
【24h】

The impact of the Q-factor of the parasitic capacitances of RF transistors on their load modulation capabilities

机译:RF晶体管寄生电容的Q因子对其负载调制能力的影响

获取原文

摘要

With the high number of users the wireless spectrum has become a valuable resource. In order to use it efficiently sophisticated coding schemes with high crest factors are used. As a result the power amplifier is operated far below maximum output power for most of the time, which results in rather low efficiency of traditional designs. Therefore efficiency enhancement methods such as the Doherty or Chireix combiner are experiencing a revival. Their performance heavily depends on the load modulation properties of the used RF transistors and unfortunately often falls behind the predicted theory, especially for high frequency operation. This paper analyses the impact of the different loss mechanisms of RF power transistors on their load modulation capabilities. Special attention was paid to the frequency dependent losses due to the limited Q-factor of the parasitic capacitance. Based on the example of a Doherty amplifier the importance of the load modulation properties for the efficiency in back off is highlighted.
机译:随着大量用户的使用,无线频谱已成为一种宝贵的资源。为了有效地使用它,使用了具有高波峰因数的复杂的编码方案。结果,功率放大器在大多数时间内都工作在远低于最大输出功率的状态,这导致传统设计的效率相当低。因此,诸如Doherty或Chireix组合器之类的效率提高方法正在复兴。它们的性能在很大程度上取决于所使用的RF晶体管的负载调制特性,并且不幸的是,常常落后于预测的理论,尤其是对于高频操作。本文分析了射频功率晶体管不同损耗机制对其负载调制能力的影响。由于寄生电容的Q因子有限,要特别注意与频率相关的损耗。基于Doherty放大器的示例,强调了负载调制特性对于后退效率的重要性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号