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Comparison of Cryogenic W band low noise amplifier based on different Ⅲ-Ⅴ HEMT foundry process and technologies

机译:基于不同Ⅲ-Ⅴ族HEMT铸造工艺和技术的低温W波段低噪声放大器的比较

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We present the results of a development activity for cryogenic Low Noise Amplifiers based on HEMT technology for ground based and space-borne application. We have developed and realized two LNA design in W band, based on m-HEMT technology. MMIC chips have been manufactured by European laboratories and companies and assembled in test modules by our team. We compare performances with other technologies and manufacturers. LNA RF properties (noise figures, S-parameters) have been measured at room and cryogenic temperature and test results are reported in this paper. Performance are compared with those of state-of-the-art devices, as available in the literature. Strengths and improvements of this project are also discussed.
机译:我们介绍了基于HEMT技术的低温低噪声放大器在地面和星载应用中的开发活动的结果。我们已经基于m-HEMT技术开发并实现了W波段的两种LNA设计。 MMIC芯片由欧洲实验室和公司制造,并由我们的团队组装在测试模块中。我们将性能与其他技术和制造商进行比较。在室温和低温下测量了LNA RF特性(噪声系数,S参数),并在本文中报告了测试结果。将性能与文献中提供的最新设备的性能进行比较。还讨论了该项目的优势和改进。

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