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Optimization of NLDMOS structure for higher breakdown voltage and lower On-Resistance

机译:优化NLDMOS结构以获得更高的击穿电压和更低的导通电阻

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摘要

In this work, high voltage NLDMOS performance in terms of high blocking voltage and On-Resistance have been investigated. In order to obtain the optimum electrical performance several key factors have been optimized such as linearity of HVNW profile, drift length and source field plate. Linear HVNW profile is obtained by linearity of HVNW mask. NLDMOS having blocking voltage of 100 V–300 V and lower On-resistance is developed based on 0.35um BCD Technology with less manufacturing cost. It is investigated that NLDMOS has poor performance over blocking voltage of 300V.
机译:在这项工作中,已经研究了在高阻断电压和导通电阻方面的高压NLDMOS性能。为了获得最佳的电气性能,已经优化了几个关键因素,例如HVNW轮廓的线性,漂移长度和源场板。线性HVNW轮廓是通过HVNW掩模的线性获得的。基于0.35um BCD技术开发的NLDMOS具有100 V–300 V的阻断电压和更低的导通电阻,具有更低的制造成本。研究表明,NLDMOS在300V的阻断电压下性能较差。

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