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A Novel Bi-Free Low Temperature Solder Paste with Outstanding Drop-Shock Resistance

机译:一种具有出色抗冲击性的新型免温焊膏

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Durafuse™ LT paste was designed as an alternative low temperature solder targeting at enabling hierarchy design for portable devices with good temperature cycling and superior drop-shock performance. It is formulated with the mixed solder powder technology to allow the paste reflowable at around 200°C or above. Durafuse™ LT formed solder joints with a melting temperature above 189°C and a plateau type reflow profile was recommended. Impact of reflow profiles on both drop shock and temperature cycling performance was investigated. The drop number increased with increasing peak temperature up to 210°C, presumably due to an improved homogeneity of solder joint. It also increased with increasing plateau time at peak temperature for temperature below 210 °C. At 210 °C, the drop number decreased with increasing plateau time, presumably due to increasing IMC thickness at pad interface. Homogeneous solder joints were more resistant to drop failure than mixed alloy system, and could be attributed to better homogeneity for the former system. Regardless of reflow profile impact, Durafuse™ LT showed at least two-order-of-magnitude higher drop shock resistance than Bi-Sn-Ag solder. Using the optimized reflow profiles, Durafuse™ LT outperformed SAC305 in drop-shock test. For LGA with homogeneous solder joint, Durafuse™ LT exhibited a characteristic life about 2.5X of BiSn0.4Ag. For chip resistor reliability in TCT, no significant difference in reliability could be discerned when comparing ENIG with OPS. Durafuse™ LT was slightly lower in reliability than SAC305. Higher peak temperature resulted in a better reliability for Durafuse™ LT. The chip size appeared to be an insignificant factor.
机译:DURAFUSE™LT糊被设计为替代的低温焊料,旨在为便携式设备提供良好的温度循环和较高的滴冲击性能的替代低温焊料。用混合焊接粉末技术配制,使糊剂在约200℃或更高的糊状物上可回流。建议使用熔融温度的Durafuse™LT形成熔化温度和高原型回流轮廓。研究了回流型材对滴冲击和温度循环性能的影响。由于焊接接头的均匀性提高,下降数随高达210℃的峰值温度的增加而增加。它也随着高原温度的增加而在低于210°C的温度下增加。在210℃下,下降数随高原时间的增加而降低,可能是由于焊盘接口处于增加的IMC厚度。均相焊点比混合合金系统更耐损坏,并且可以归因于前系统的更好均匀性。无论回流轮廓冲击如何,Durafuse™LT显示出比Bi-SN-AG焊料的至少两个阶数高的抗冲击性。使用优化的回流配置文件,DURAFUSE™LT超现了DAP-SCHICK测试的SAC305。对于带均匀焊接接头的LGA,DURAFUSE™LT表现出约2.5倍BISN0.4ag的特征寿命。对于TCT中的芯片电阻可靠性,在将ENIG与OPS比较时,可以辨别出可靠性的显着差异。 Durafuse™LT的可靠性略低于SAC305。较高的峰值温度导致DURAFUSE™LT的可靠性更好。芯片尺寸似乎是一种微不足道的因素。

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