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Low Density Carrier Mobility in Silicon and Gallium Arsenide by Two-Photon Time-Resolved Terahertz Spectroscopy

机译:通过双光子时间分辨的太赫兹光谱分谱光谱光谱法在硅和砷化镓中的低密度载流子迁移

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Below bandgap two-photon excitation of bulk silicon and gallium arsenide samples is used to evenly generate low density carriers (<1013 cm−3) throughout the entire sample thickness. Analysis of the frequency-dependent THz conductivity as a function of density allows determination of mobility at lower densities than previously examined using Hall contact measurements.
机译:下面的带隙双光子激发散装硅和砷化镓样品用于均匀地产生低密度载体(<10 13 厘米 -3 )在整个样本厚度。随着密度函数的函数依赖性THz电导率的分析允许在较低密度下测定比先前使用霍尔接触测量检查的迁移率。

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