Characteristics of l minescence luminescence solar cells radiation

摘要

At present there are known many of diagnostic methods of detection defects of silicon solar cells. This paper deals about results of new potential in to use one ofcharacteristics luminescence radiation for detection defects of solar cells. Polarization spectroscopy of defect in solar cells may be used to fitting characterization of silicon solarcells. This can lead to understand the electrical properties of defects in silicon solar cells and study of really formation defects. We tried measuring with electroluminescencetechnology extending about existing polarization spectroscopy to yield the polarization of luminescence radiation by defect in solar cells.Radiation emitted by the solar cell has a wave character that can interact with the silicon structures or hypothetically thin reflectance layer of solar cells. In our research inone case we can observed the partially linear polarization luminescence light on poly-silicon crack defect. Spectral response of using CCD camera is approximately 300 to 1100nm. Sinusoid dependence of luminescence intensity on the angle of linear polarization analyzer rotation shown this fact. The degree of polarization depends on the material, inthis case the character of defect. Polarized light can be obtained in various ways. This fact opens up for potential next new questions in this widely course of study diagnosticsdefects silicon solar cells.