首页> 中文期刊> 《中国物理快报:英文版》 >Photoluminescence Analysis of Injection-Enhanced Annealing of Electron Irradiation-Induced Defects in GaAs Middle Cells for Triple-Junction Solar Cells

Photoluminescence Analysis of Injection-Enhanced Annealing of Electron Irradiation-Induced Defects in GaAs Middle Cells for Triple-Junction Solar Cells

         

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  • 来源
    《中国物理快报:英文版》 |2016年第5期|67-70|共4页
  • 作者单位

    Key Laboratory of Beam Technology and Materials Modification of Ministry of Education,College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875;

    Key Laboratory of Beam Technology and Materials Modification of Ministry of Education,College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875;

    Key Laboratory of Beam Technology and Materials Modification of Ministry of Education,College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875;

    Key Laboratory of Beam Technology and Materials Modification of Ministry of Education,College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875;

    Key Laboratory of Beam Technology and Materials Modification of Ministry of Education,College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875;

    Beijing Radiation Center, Beijing 100875;

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  • 正文语种 eng
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