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Deposition and characterization of nanostructural IrO_x by RF sputtering

机译:射频溅射沉积和表征纳米结构IrO_x

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Large surface area nanostructural IrO_x films were deposited on stainless steel substrates by reactive radio frequency magnetron sputtering using Ir metal target. The structural and spectroscopic properties of the nanostructural IrO_x were characterized. The micrographs of field emission scanning electron microscopy showed the formation of folded leaves with chiffon-like structure for the as-deposited samples. X-ray photoelectron spectroscopy analysis provided the information of the oxidation states and the stoichiometry of IrO_xNL. Raman spectra revealed the amorphous-like phase of the as-deposited nanostructural IrO_x. The chiffon-like structure provides ultra-high surface area for electrical charge storage which makes the IrO_xNL as an attractive candidate for the supercapacitor application.
机译:通过使用Ir金属靶进行反应性射频磁控溅射,将大表面积的纳米结构IrO_x膜沉积在不锈钢基板上。表征了纳米结构IrO_x的结构和光谱性质。场发射扫描电子显微镜的显微照片显示,所沉积的样品形成了具有雪纺样结构的折叠叶片。 X射线光电子能谱分析提供了IrO_xNL的氧化态和化学计量信息。拉曼光谱揭示了所沉积的纳米结构IrO_x的非晶态相。雪纺状结构为电荷存储提供了超高的表面积,这使得IrO_xNL成为超级电容器应用的诱人候选物。

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