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Bulk Synthesis and Structural Determination of High Mobility Multication Transparent Conducting Oxides

机译:高迁移率多阳离子透明导电氧化物的本体合成与结构测定

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This work reports the synthesis of novel quaternary transparent conducting oxide Cd_(1-x)Sn_(1-x)In_xGa_xO_3 (x = 0.1, 0.2, 0.3) at 1225°C via solid state reaction route. The investigations on structural, optical and electrical properties have been carried out. Powder X-ray diffraction revealed the phase purity and distorted orthorhombic structure of the species synthesized. Distortion of the structure is due to the substitution of In~(3+) and Ga~(3+) in CdSnO_3 (JCPDS card no.340885) matrix. The optical transmittance approximated by the reflectance shows considerable increase in the transmittance of visible light along with the increase of substitution. Typical Burstein-Moss effect is observed with the increase in x value as a variation in optical bandgap from 2.7 to 2.9 eV. Four point Hall measurements by Van der-Pauw method exhibit superior properties in charge carrier concentration and mobility. Maximum bulk charge concentration of 4.78×10~(17) cm~(-3) is obtained for x = 0.3. Hall mobility depends on carrier concentration and steeply increases with the carrier concentration. Considerable drop in the resistivity of the material along with higher transmittance is a critical finding in the experiment.
机译:这项工作报告了固态反应途径在1225°C下合成新型四元透明导电氧化物Cd_(1-x)Sn_(1-x)In_xGa_xO_3(x = 0.1,0.2,0.3)。已经对结构,光学和电学性质进行了研究。粉末X射线衍射揭示了所合成物种的相纯度和扭曲的正交结构。结构变形是由于在CdSnO_3(JCPDS卡号340885)矩阵中替换了In〜(3+)和Ga〜(3+)。由反射率近似的光学透射率显示出可见光的透射率随着取代的增加而显着增加。随着x值的增加,光学带隙从2.7 eV到2.9 eV的变化,观察到典型的Burstein-Moss效应。用范德堡方法进行的四点霍尔测量在电荷载流子浓度和迁移率方面显示出优异的性能。当x = 0.3时,最大体积电荷浓度为4.78×10〜(17)cm〜(-3)。霍尔迁移率取决于载流子浓度,并随载流子浓度急剧增加。材料的电阻率显着下降以及更高的透射率是实验中的关键发现。

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