Simulation of Fatigue Damage in Clusters of DMOS Cells Subjected to Non-Uniform Transient Thermo-Mechnical Loading

机译：非均匀瞬时热机械负荷对DMOS细胞簇簇抗疲劳损伤的模拟

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Numerical predictions of thermo-mechanical fatigue in power semiconductors are carried out under consideration of transient thermo-mechanical loading conditions. An existing approach to model bulk fatigue damage is extended towards the usage of more gener

机译：在考虑瞬态热机械负载条件下进行功率半导体热机械疲劳的数值预测。现有的模型散发疲劳损坏的方法延长了更多的使用

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《International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems》|2020年|395p|共9页
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Paul Hoffmann; Michael Nelhiebel; Balamurugan Karunamurthy; Heinz E. Pettermann; Melanie Todt;
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中图分类自动模拟理论（自动仿真理论）;
关键词
Fatigue; Transient analysis; Loading; Temperature; Finite element analysis; Thermal loading; Thermal analysis;

机译：疲劳;瞬态分析;装载;温度;有限元分析;热负荷;热分析;

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4. Simulation of Fatigue Damage in Clusters of DMOS Cells Subjected to Non-Uniform Transient Thermo-Mechnical Loading [C] . Paul Hoffmann, Michael Nelhiebel, Balamurugan Karunamurthy, International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems . 2020

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Simulation of Fatigue Damage in Clusters of DMOS Cells Subjected to Non-Uniform Transient Thermo-Mechnical Loading

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