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Chip Package Co-design and Physical Verification for Heterogeneous Integration

机译:芯片封装共同设计和物理验证的异构整合

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Physical verification of components in 2.5D and 3D integrated chips is challenging because existing tool flows have evolved from monolithic silicon design. These components are typically designed on separate technology nodes nearly independent of each other and integrated along the design cycle. We developed an integration and verification methodology with a physical design driven approach which is data-light and can be adapted anytime in the design process. We verified this methodology across multiple package designs spanning a range of process technology nodes. This methodology is applicable to any heterogeneous integration technology involving multiple dies and can be deployed early in the design cycle.
机译:2.5D和3D集成芯片中组件的物理验证是具有挑战性的,因为现有的刀具已经从单片硅设计中发展。 这些组件通常在单独的技术节点上设计,几乎独立于彼此,并沿着设计周期集成。 我们开发了一种具有物理设计驱动方法的集成和验证方法,该方法是数据光,可以在设计过程中随时适应。 我们通过跨越一系列过程技术节点的多个包装设计验证了该方法。 该方法适用于任何涉及多个模具的异构集成技术,可以在设计周期中提前部署。

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