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IntelliSuite EMagAnalysis: an S-parameter Extraction Tool for Real Deformed Structures

机译:IntelliSuite Emaganalysis:用于真正变形结构的S参数提取工具

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This paper discusses the method to extract S-parameters of real deformed MEMS devices with the combination of IntelliSuite EMagAnalysis and IntelliSuite TEMAnalysis, and the use of the data structure compatibility of these two analysis modules. Through this novel method that has been developed, more accurate results are gotten when analyzing a classical structure of RF switch.
机译:本文讨论了利用IntelliSuite eMaganysics和IntelliSuite Temanalys的组合提取了真实变形MEMS器件的S参数的方法,以及使用这两个分析模块的数据结构兼容性。通过这种新的方法已经开发出来,在分析RF开关的经典结构时得到了更准确的结果。

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