首页> 外文会议>Asia Symposium on Quality Electronic Design >An electrical study of differential clock die-to-die interconnection in multi-chip packages
【24h】

An electrical study of differential clock die-to-die interconnection in multi-chip packages

机译:对多芯片封装中的差分时钟芯片间互连的电气研究

获取原文

摘要

This paper presents an electrical study on die-to-die interconnect, differential clock signals in MCPs. The paper seeks to tackle the issues caused by shorter and denser interconnection in combination with an ever-decreasing z-height profile. The proposed methods focus on buffer and channel design on existing or new signaling. Of note, they maintain a fair amount of design flexibility, while not jeopardizing overall margins. The methods primarily mitigate harmful ringing, ledge effects and excessively slow slew rates in the monotonic region in both MCP and discrete solutions. Ultimately, this translates into a shift in line with recent platforms' sleek and thin form factor and in turn, a cost saving benefit.
机译:本文对MCP中的芯片间互连,差分时钟信号进行了电气研究。本文旨在解决因互连长度越来越短,密度越来越高以及z高度轮廓不断减小而引起的问题。所提出的方法集中于现有或新信令上的缓冲器和信道设计。值得注意的是,它们在保持设计灵活性的同时,不会损害整体利润。该方法主要减轻了在MCP和离散解决方案中单调区域中的有害振铃,突耳效应和过慢的摆率。最终,这将转变为与最新平台的时尚轻薄外形相适应的转变,进而节省成本。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号