首页> 外文会议>IEEE/CPMT International Electronic Manufacturing Technology Symposium;IEMT >An investigation on Cu wire bond corrosion and mitigation technique for automotive reliability
【24h】

An investigation on Cu wire bond corrosion and mitigation technique for automotive reliability

机译:铜线键合腐蚀与缓解技术的汽车可靠性研究

获取原文

摘要

The increase of gold price had pushed industrial to develop copper wire in order to stay competitive. However, copper is not precious material like gold, there are numerous challenges in bonding & reliability risk associated with stringent automotive reliability requirements. Corrosion associated with copper wire bonding is considered one of the hard to solve reliability risk as the occurrence is in very low ppm and there was no specific pattern observed on the corroded bondpad location. This paper is focusing on the copper wire interconnect with Aluminum pad corrosion in humidity test including autoclave and temperature humidity bias test.
机译:黄金价格的上涨推动了工业发展铜线​​以保持​​竞争力。但是,铜不是像金那样的贵重材料,与严格的汽车可靠性要求相关的粘接和可靠性风险面临许多挑战。与铜线键合相关的腐蚀被认为是难以解决的可靠性风险之一,因为这种情况的发生率非常低,而且在被腐蚀的焊盘上没有观察到特定的图案。本文主要针对包括高压釜和温度湿度偏差测试在内的湿度测试中的带有铝垫腐蚀的铜线互连。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号