首页> 外文会议>European Photovoltaic Solar Energy Conference and Exhibition >EXPERIMENTAL STUDY OF LIGHT-INDUCED DEGRADATION IN A-SI:H THIN-FILM MODULES UNDER DIFFERENT CLIMATIC CONDITIONS
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EXPERIMENTAL STUDY OF LIGHT-INDUCED DEGRADATION IN A-SI:H THIN-FILM MODULES UNDER DIFFERENT CLIMATIC CONDITIONS

机译:不同气候条件下A-SI:H薄膜组件光致降解的实验研究

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The light induced degradation of amorphous silicon photovoltaic modules is a big issue formanufacturers of this technology. The Staebler-Wronksi and annealing effects describe this reversible processcausing the degradation of power that results in a loss of efficiency. Under outdoor conditions the situation is morecomplex and there are factors that determine the final extent of the degradation. This work is focused in the effect ofclimatic conditions on the degradation process. Four batches of industrially manufactured a-Si:H photovoltaicmodules with different sets of process parameters for the deposition of layers have been deployed in the four seasonsof the year for an extensive study of the LID under different climatic conditions. Through this testing, the extent ofthe LID caused by Staebler-Wronski effect is characterized by means of the characteristic parameters of the modules.
机译:光诱导非晶硅光伏组件的降解是一个大问题 这项技术的制造商。 Staebler-Wronksi和退火效应描述了这种可逆过程 导致功率下降,导致效率降低。在室外条件下,情况更多 复杂的因素决定了降解的最终程度。这项工作的重点是 气候条件对降解过程的影响。四批工业生产的a-Si:H光伏 在四个季节中,已部署了具有不同工艺参数集以用于沉积层的模块 在不同气候条件下对LID进行广泛研究的年度报告。通过此测试,程度 由Staebler-Wronski效应引起的LID通过模块的特征参数来表征。

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