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SILICON HETEROJUNCTION SOLAR CELLS ON N- AND P-TYPE WAFERS WITH EFFICIENCIES ABOVE 20

机译:效率在20%以上的N型和P型晶圆上的硅异质结太阳能电池

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A systematic comparison of front- and rear-emitter silicon heterojunction solar cells produced on nandp-type wafers was performed, in order to investigate their potential and limitations for high efficiencies. Cells onp-type wafers suffer from reduced minority carrier lifetime in the low-carrier-injection range, mainly due to theasymmetry in interface defect capture cross sections. This leads to slightly lower fill factors than for n-type cells.However, these losses can be minimized by using high-quality passivation layers. High V_(oc)s were obtained on bothtypes of FZ wafers: up to 735 mV on n- and 726 mV on p-type. The best V_(oc) measured on CZ p-type wafers was only692 mV, whereas it reached 732 mV on CZ n-type. The highest aperture-area certified efficiencies obtained on 4 cm~2cells were 22.14% (V_(oc)=727 mV, FF=78.4%) and 21.38% (V_(oc)=722 mV, FF=77.1%) on n- and p-type FZ wafers,respectively, demonstrating that heterojunction schemes can perform almost as well on high-quality p-type as on ntypewafers. To our knowledge, this is the highest efficiency for a full silicon heterojunction solar cell on a p-typewafer, and the highest V_(oc) on any p-type crystalline silicon device with reasonable FF.
机译:在nand上生产的前后发射极硅异质结太阳能电池的系统比较 为了研究p型晶圆的潜力和对高效率的局限性,进行了p型晶圆。电池开启 p型晶圆在低载流子注入范围内的少数载流子寿命会缩短,这主要是由于 界面缺陷捕获截面中的不对称性。这导致填充因子比n型单元略低。 但是,通过使用高质量的钝化层可以将这些损失降到最低。两者均获得高V_(oc) FZ晶片的类型:n型高达735 mV,p型高达726 mV。在CZ p型晶片上测得的最佳V_(oc)仅 692 mV,而在CZ n型上达到732 mV。在4 cm〜2上获得最高的孔径面积认证效率 在n型和p型FZ晶圆上,电池分别为22.14%(V_(oc)= 727 mV,FF = 78.4%)和21.38%(V_(oc)= 722 mV,FF = 77.1%), 分别证明了异质结方案在高质量p型和ntype上的性能几乎相同 威化饼。据我们所知,这是p型全硅异质结太阳能电池的最高效率 晶圆,以及具有合理FF的任何p型晶体硅器件上的最高V_(oc)。

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