首页> 外文会议>International Conference on Electronic Packaging Technology and High Density Packaging >Suppressing effect of 1 wt. nano-TiO2 addition into low Ag content Sn-Ag-Cu solder alloy on the intermetallic growth with Cu substrate during isothermal aging
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Suppressing effect of 1 wt. nano-TiO2 addition into low Ag content Sn-Ag-Cu solder alloy on the intermetallic growth with Cu substrate during isothermal aging

机译:在低温度下等温老化过程中,向低银含量的Sn-Ag-Cu焊料合金中添加1 wt。%纳米TiO2对与Cu基底金属间生长的抑制作用

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This study investigated the effects of adding 1 wt.% nano-TiO2 particles into low-Ag content Sn0.35Ag0.7Cu (SAC) lead-free solder alloys on the growth of intermetallic compounds (IMC) with Cu substrates during solid-state isothermal aging at temperatures of 125, 150, and 175 °C for up to 7 days. The results indicate that the morphology of the Cu6Sn5 phase transformed from scallop-type to layer-type in low-Ag SAC composite solder/Cu joints. The growth rate of these IMCs increased with the aging temperature and time. Kinetics analyses showed that growth of the overall IMC layers was diffusion controlled. The apparent activation energies for the growth of overall IMC layers are calculated to be 50.62 kJ/mol.
机译:这项研究调查了向低Ag含量的Sn0.35Ag0.7Cu(SAC)无铅焊料合金中添加1 wt。%纳米TiO 2 颗粒对金属间化合物(IMC)生长的影响在125、150和175°C的固态等温老化过程中,使用Cu基板进行长达7天的测试。结果表明,在低Ag SAC复合焊料/ Cu接头中,Cu 6 Sn 5 相的形态从扇贝形转变为层状。这些IMC的生长速率随着老化温度和时间的增加而增加。动力学分析表明,整个IMC层的生长是受扩散控制的。计算出整个IMC层的生长的表观活化能为50.62 kJ / mol。

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