Dislocation densities, slip-system types and Burgers vector populations in hexagonal and cubic crystals from X-ray line profile analysis

摘要

X-ray diffraction line profile analysis can be carried out on the hkl planes corresponding to the same texture component or the same crystal lographic orientation fiber. It is shown that in textured polycrystalline materials or in thin films or multilayers X-ray line profiles measured on planes corresponding either to the main or the minor texture components can provide the Burgers vector population and dislocations densities in the different texture components separately. The experimental technique is outlined for textured specimens and the multiple convolutional whole profile method, i.e. the CMWP line profile analysis procedure, is presented for its capacity to determine the substructure pertaining to different texture components in textured samples.