首页> 外文会议>Annual SID symposium, seminar, and exhibition;Display Week 2011 >High Reliable In-Ga-Zn-Oxide FET Based Electronic Global Shutter Sensors for In-Cell Optical Touch Screens and Image Sensors
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High Reliable In-Ga-Zn-Oxide FET Based Electronic Global Shutter Sensors for In-Cell Optical Touch Screens and Image Sensors

机译:基于高可靠性In-Ga-Zn-Oxide FET的电子全局快门传感器,用于单元内光学触摸屏和图像传感器

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摘要

A 6 inch XGA LCD touch screen with optical sensors in its pixels, using oxide semiconductor (OS) FETs has been developed. The extremely low off-state current of the OS FET facilitates the use of a global shutter and leads to an improved accuracy of touch detection. The possibility of a novel application of a touch screen and an image sensor that is an application of the combination of OS FETs and global shutter is proposed.
机译:已经开发出一种6英寸XGA LCD触摸屏,该触摸屏的像素中装有光学传感器,并使用氧化物半导体(OS)FET。 OS FET的关断状态电流极低,这有利于全局快门的使用,并提高了触摸检测的准确性。提出了将触摸屏和图像传感器应用于OS FET和全局快门的组合的新型应用的可能性。

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