首页> 外文会议>Annual SID symposium, seminar, and exhibition;Display Week 2011 >Invited Paper: Surface Electronic States of MgO Induced by Auger Neutralization Process
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Invited Paper: Surface Electronic States of MgO Induced by Auger Neutralization Process

机译:受邀论文:俄歇中和过程诱导的MgO表面电子态

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The surface electronic states of MgO are measured at Auger neutralization condition with an ion excitation source by using thermoluminescence (TL) spectroscopy. The advantage of this method is that the dynamic properties of excited states at the topmost MgO surface could be measured at the same conditions as y measurement. Luminescence, activation energy, lifetime of trapped states are discussed.
机译:MgO的表面电子态是通过热致发光(TL)光谱在离子激发源的俄歇中和条件下测量的。该方法的优点是,可以在与y测量相同的条件下测量最顶部MgO表面激发态的动态特性。讨论了发光,活化能,俘获态的寿命。

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