首页> 外文会议>The 54th IEEE International Midwest Symposium on Circuits and Systems >Simultaneous switching noise coupling through via transition for a CMOS negative feedback Operational Amplifier in System-in-Package
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Simultaneous switching noise coupling through via transition for a CMOS negative feedback Operational Amplifier in System-in-Package

机译:通过系统级封装的CMOS负反馈运算放大器,通过通孔转换同时耦合开关噪声

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摘要

In this paper, a modeling method [1] is proposed to investigate the simultaneous switching noise coupling path and effects on the Operational Amplifier (Op-Amp). This method combines an analytical model and interconnection models for the chip-package co-modeling and co-analysis. CMOS Op-Amp is fabricated by TSMC 0.25um to validate the modeling method. It was successfully demonstrated by simulation and measurement with SSN noise, which has the frequency from 10MHz to 3GHz. It shows the necessity for the chip-package co-modeling and co-simulation of the System-In-Package (SIP).
机译:本文提出了一种建模方法[1],以研究同时开关噪声耦合路径及其对运算放大器(Op-Amp)的影响。该方法将分析模型和互连模型结合在一起,用于芯片封装的协同建模和协同分析。台积电(TSMC)0.25um制造了CMOS运算放大器以验证建模方法。通过SSN噪声的仿真和测量成功地证明了这一点,该噪声的频率为10MHz至3GHz。它显示了系统级封装(SIP)的芯片封装协同建模和协同仿真的必要性。

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