首页> 外文会议>European Photovoltaic Solar Energy Conference and Exhibition >OPTIMIZATION OF SULPHURIZATION TEMPERATURE FOR OBTAINING DENSE Cu_2ZnSnS_4 FILMS WITH PHASE PURITY AND PREFERRED COMPOSITION
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OPTIMIZATION OF SULPHURIZATION TEMPERATURE FOR OBTAINING DENSE Cu_2ZnSnS_4 FILMS WITH PHASE PURITY AND PREFERRED COMPOSITION

机译:用相纯度和优选组合物获得致密Cu_2ZnSnS_4膜的硫化温度优化

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摘要

This study focusses on the effect of sulphurization temperature on properties of Cu_2ZnSnS_4 (CZTS). Cu-Zn-Sn precursor films were co-electrodeposited using electrolyte containing salts of Cu, Zn and Sn and a complexing agent (tri-sodium citrate) followed by sulphurization in inert atmosphere (Ar) at different temperatures ranging from 250°C to 600°C for 30 minutes. Samples sulphurized at these temperatures were characterized for structure, morphology and composition. XRD and Raman spectroscopy suggested that, sample sulphurized at 500°C has a phase purity unlike samples sulphurized at 450°C, 550°C and 600°C which showed peaks corresponding to CZTS phase along with some impurity phases. SEM images for samples sulphurized at 450°C, 500°C, 550°C and 600°C indicated compact morphology but, only the sample sulphurized at 500°C showed preferred composition for CZTS absorber material. Structural, morphological, compositional studies suggested that, sample sulphurized at 500°C resulted in CZTS film with characteristics for an absorber layer for thin film solar cell.
机译:本研究侧重于硫化温度对Cu_2ZNSNS_4(CZTS)性能的影响。 Cu-Zn-Sn前体膜使用含Cu,Zn和Sn的盐的电解质和络合剂(三氢钠),然后在惰性气氛(Ar)下的不同温度范围为250℃至600 °C 30分钟。在这些温度下硫化的样品的特征在于结构,形态和组合物。 XRD和拉曼光谱表明,在500℃下硫化的样品具有相纯度,其不同于450℃,550℃和600℃的样品,其显示对应于CZTS相的峰以及一些杂质相。用于在450℃,500℃,550℃和600℃下硫化的样品的SEM图像表明了紧凑的形态,但是,仅在500℃下硫化的样品显示了CZTS吸收剂材料的优选组合物。结构,形态学,成分研究表明,在500℃下硫化的样品导致CZTS膜,具有用于薄膜太阳能电池的吸收层的特性。

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