A Robust Solution for Embedded Memory Test and Repair

机译：嵌入式存储器测试和修复的可靠解决方案

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This paper presents a robust solution for test and repair of embedded memories. The STAR (Self-Test and Repair) Memory System solution is developed within Synopsys Design Ware allowing users to create, integrate and verify embedded memory test and repair IP in system on chips. The key components and features of the SMS are discussed.

机译：本文提出了一种用于测试和修复嵌入式存储器的强大解决方案。 STAR（自检和修复）存储系统解决方案是在Synopsys Design Ware中开发的，允许用户创建，集成和验证嵌入式系统芯片上的存储器测试和修复IP。讨论了SMS的关键组件和功能。

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《Proceedings of the Twentieth Asian Test Symposium》|2011年|p.461-462|共2页
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Darbinyan K.; Harutyunyan G.; Shoukourian S.; Vardanian V.; Zorian Y.;
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中图分类调整、测试、校验;
关键词
SMS; built-in self-test; embedded test and repair; memory BIST; test algorithms;

机译：短信;内置自检;嵌入式测试与修复;内存BIST;测试算法;

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专利

1. Embedded-memory test and repair: infrastructure IP for SoC yield [J] . Zorian Y., Shoukourian S. IEEE Design & Test of Computers Magazine . 2003,第3期

机译：嵌入式内存测试和修复：提高SoC产量的基础架构IP
2. The Efficiency and Accuracy of The Test of Memory Malingering Trial 1, Errors on the First 10 Items of The Test of Memoryn Malingering, and Five Embedded Measures in Predicting Invalid Test Performance [J] . John H. Denning Archives of Clinical Neuropsychology . 2012,第4期

机译：记忆障碍测试的效率和准确性试验1，记忆障碍测试的前10个项目存在错误，以及五个用于预测无效测试性能的嵌入式措施
3. Evaluating the accuracy of the Wechsler Memory Scale-Fourth Edition (WMS-IV) logical memory embedded validity index for detecting invalid test performance [J] . Jason R. Soble, Kathleen M. Bain, K. Chase Bailey, Applied neuropsychology. Adult . 2019,第3a4期

机译：评估Wechsler内存量表第四版（WMS-IV）逻辑内存嵌入式有效性索引的准确性，用于检测无效的测试性能
4. A Robust Solution for Embedded Memory Test and Repair [C] . Darbinyan K., Harutyunyan G., Shoukourian S., Asian Test Symposium . 2011

机译：嵌入式内存测试和修复的强大解决方案
5. Fully digital-compatible built-in self-test solutions to linearity testing of embedded mixed-signal functions. [D] . Xing, Hanqing. 2008

机译：完全数字兼容的内置自测解决方案，用于嵌入式混合信号功能的线性测试。
6. The Efficiency and Accuracy of The Test of Memory Malingering Trial 1 Errors on the First 10 Items of The Test of Memory Malingering and Five Embedded Measures in Predicting Invalid Test Performance [O] . John H. Denning -1

机译：记忆障碍测试的效率和准确性试验1记忆障碍测试的前10个项目存在错误以及五个用于预测无效测试性能的嵌入式措施
7. Comparison of Select Advanced Clinical Solutions Embedded Effort Measures to the Word Memory Test in the Detection of Suboptimal Effort [O] . P. Armistead-Jehle, B. Buican 2013

机译：精选高级临床解决方案嵌入式努力测量在次优努力检测中对存储器测试的措施

A Robust Solution for Embedded Memory Test and Repair

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